MICA Microscope image control & acquisition Windows 98 / 2000 / XP PC Active Beam Control. Variable formats from 64 x 64 to 2048 x 2048 pixel in 1:1 and 4:3 aspect ratio. Rapid cycling preview image and slow scan with averaging filters. Auto contrast and brightness. Line-scan in any direction against reference image. Probe positioning on reference image for point analysis and labeling. Selectable analogue input channels (SE, BSE, EBIC, CL). Simultaneous acquisition of 4 elemental X-ray maps for EDX or WDX. Hardware features: PCI Bus pnp card. 16 bit precision D/A converters for scan generation and probe positioning. Low noise power supply for signal and scan driver amplifiers. 16 bit A/D converters for analogue input signals with dynamic noise reduction and anti-aliasing filters. 4 channel 16 bit 20 MHz counters (Expandable with additional cards). Software features: Images stored in Windows BMP format. Annotation and labeling of images plus calibrated micron-marker bar. Line-scan control either one shot or cycling with Full control of pixel dwell time. Mapping with control of pixel dwell time and display of input count for all channels. Dedicated image combine and overlay software MICA options are also available for Lithography, XPS, SIMS and Auger Spectroscopy For more details of Surface Science Applications contact: www.datasystems.co.uk